Aim-TTi TGP3122 Pulse Generator, 1 mHz min, 25 (Double Pulse) MHz, 50 (Pulse) MHz max, With RS Calibration

This pulse generator by Aim-TTi offers precise and adjustable output amplitude, making it ideal for a wide range of applications across different industries. It features a compact bench-top design and advanced double pulse capabilities, ensuring accurate waveform generation for various testing requirements. With a focus on reliability and performance, this generator is a valuable tool for professionals seeking high-quality waveform generation solutions.

• The output amplitude can be adjusted to precisely control the strength of the generated waveforms
• This device is capable of producing two identical pulses in each cycle, with adjustable delays between them
• The feature of Function/Arbitrary Waveform Generation offers the flexibility to generate a wide variety of waveforms for different applications
• Various modulation options are provided for adjusting the amplitude, frequency, and phase of the waveforms
• It covers a wide frequency range, making it suitable for testing in various scenarios
• Low jitter operation is ensured to maintain accurate waveform timings

• Ideal for stress testing and signal characterisation in electronic designs
• Can be used for simulating clock frequencies with glitch-free performance
• Enables the creation of custom data patterns for testing serial communication systems
• Useful for conditioning pulse signals in various electronic applications

Yes, it is capable of generating custom pulse patterns, allowing users to create specific waveforms tailored to their testing needs.

Yes, it supports external modulation sources, providing flexibility for users to integrate additional modulation capabilities into their testing setups.

Yes, it is compatible with common LabVIEW software, facilitating seamless integration and control for users familiar with LabVIEW environments.

Yes, it offers precise amplitude control for output waveforms, ensuring accuracy and consistency in signal generation for various testing applications.